Technology and Methodology |
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A NOVEL METHOD FOR DETECTING AND CORRECTING CCD IMAGE
MALFUNCTION PIXELS BASED ON SPATIAL AND TEMPORAL STATISTICS |
ZENG Qi-ming 1, JIA Jian-ying 2 |
1.Institute of Remote Sensing & GIS, Peking University, Beijing 100871, China; 2.Beijing Municipal Key Lab for Spatial Information Science and Engineering Application, Beijing 100871, China |
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Abstract Due to inevitable manufacture defects, there exist a lot of malfunction pixels in the CCD image. The traditional detecting method must require a series of sample images for standard objects taken under a specific condition. Starting with an analysis of electro-optical response characteristics of the CCD pixel, this paper classifies the detected malfunction pixels and makes a statistical analysis on a series of images taken in different scenes. On such a basis, the defective pixels are detected and corrected. A study of a series of aerial CCD images has proved the efficiency of this new method.
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Issue Date: 10 September 2009
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